Spitzer Microlens Measurement of a Massive Remnant in a Well-separated Binary

Shvartzvald, Y. and Udalski, A. and Gould, A. and Han, C. and Bozza, V. and Friedmann, M. and Hundertmark, M. and and and Beichman, C. and Bryden, G. and Calchi Novati, S. and Carey, S. and Fausnaugh, M. and Gaudi, B. S. and Henderson, C. B. and Kerr, T. and Pogge, R. W. and Varricatt, W. and Wibking, B. and Yee, J. C. and Zhu, W. and Spitzer Team and Poleski, R. and Pawlak, M. and Szymański, M. K. and Skowron, J. and Mróz, P. and Kozłowski, S. and Wyrzykowski, Ł. and Pietrukowicz, P. and Pietrzyński, G. and Soszyński, I. and Ulaczyk, K. and OGLE Group and Choi, J. -Y. and Park, H. and Jung, Y. K. and Shin, I. -G. and Albrow, M. D. and Park, B. -G. and Kim, S. -L. and Lee, C. -U. and Cha, S. -M. and Kim, D. -J. and Lee, Y. and KMTNet Group and Maoz, D. and Kaspi, S. and Wise Group and Street, R. A. and Tsapras, Y. and Bachelet, E. and Dominik, M. and Bramich, D. M. and Horne, Keith and Snodgrass, C. and Steele, I. A. and Menzies, J. and Figuera Jaimes, R. and Wambsganss, J. and Schmidt, R. and Cassan, A. and Ranc, C. and Mao, S. and Dong, Subo and RoboNet and D’Ago, G. and Scarpetta, G. and Verma, P. and Jørgensen, U. G. and Kerins, E. and Skottfelt, J. and MiNDSTEp

ApJ