Spitzer Documentation & Tools
MIPS Instrument Handbook

3.1  Photometry Mode

Although both photometry and super resolution were supported in a single AOT, for illustration we describe the procedures separately.  The photometry mode was designed to obtain multi-band observations of reasonably compact sources; sources that are too extended for the procedures described below should generally have been imaged using MIPS scan mapping (section 3.2) instead.  Super resolution emphasizes robust sampling of the point spread function through a combination of small pixels relative to the Airy disk and of sub-stepping of the image relative to the pixels.  Special observing modes were used to achieve this goal at 70 and 160 micron, and at 70 micron a separate optical train providing a finer pixel scale was also employed.  Note that super-resolution data requires additional post-processing (beyond what the Spitzer pipeline provides) to extract higher spatial resolution. 


In the following descriptions, we give overly specific examples with particular pixel addresses for where the image falls.  We do so for purposes of illustration only.  Actual placements on the arrays may not be exactly those given here, but relative placement remains.  Observers are referred to Table 3.4 below for a summary of photometry mode integration times.  Note also that the multiplicity of frames is prescribed within the AOTs, and the observer selected the number of times (cycles) to repeat the basic pattern of a template in order to build up the desired integration time.


There are multiple options within the photometry AOT. ''Compact source'' can also be referred to as ''small field, '' and ''large source'' as ''large field. '' Additionally, for 70 micron, ''fine scale'' pixels can also occasionally be referred to as ''narrow field, '' and ''default scale'' can be described as ''coarse scale. ''