Overview: An "Extragalactic Performance Estimation Tool" (EX-PET)
to estimate the flux density in the Spitzer IRAC + MIPS imaging
passbands for various point source SEDs. For user configured Spitzer
observing parameters, the PET also returns an estimate of the instrument
sensitivity, total integration depth per pixel, and expected
S/N.
Input: choose an SED model, set normalization
parameters, expected background level, and configure IRAC/MIPS
instrument settings.
Output: summary of SED properties,
intrinsic flux , color corrections and observed flux in the Spitzer
passbands and a signal-to-noise estimate for the observing parameters
chosen.
Note: these are provided as a guideline
only. Observers are responsible for verifying the expected source flux
densities for their observations.
Choose a SED model, and set normalization parameters. For the
normalization, specify the flux density (in mJy) at a specified
wavelength. If the flux density is unknown, but a magnitude is, the
online
"Magnitude-to-Flux-Density Converter" can do the conversion.
Choices for the SED model are:
COMPOSITE SED: The
composite SEDs were obtained by averaging multiwavelength
observations of 59 galaxies, classified into the following
categories:
See: Schmitt, Kinney, Calzetti and Bergmann, 1997, AJ, 114, 592
for further details.
User input: object class from
the list above, redshift, normalization, and wavelength of the normalization, (both in the observer's
frame), to specify
[default is ].
NAMED OBJECT SED: Similar
to the composite SEDs in the
class above, these are a compilation of multiwavelength
observations of a single selected, representative galaxy in the
classes listed under composite
SEDs above (e.g., LINER, Seyfert 2, etc.)
User input: object SED, redshift, normalization, and wavelength of the normalization, (both in the observer's
frame), to specify
[default is ].
In general, the IR background contribution is a combination of the
zodiacal light, interstellar medium, and cosmic background
radiation. At IRAC wavelengths, the background is dominated by
zodiacal light, so a general rule-of-thumb is that the background
is ``low'' near the ecliptic poles (absolute ecliptic latitude
greater than about 60 degrees), ``high'' if it is in the ecliptic
plane (absolute ecliptic latitude less than 30 degrees, say), and
``medium'' for all other ecliptic latitudes.
For all of the Spitzer instruments, the background estimates were
generated using a prototype version of the Spitzer background
estimator. Three lines of sight were chosen to represent
low, medium, and high background
observations, depending upon galactic/ecliptic latitude of the
target. The lines of sight were as follows:
The background model includes the zodiacal light, interstellar medium
(cirrus), and the cosmic infrared background (at wavelengths greater
than 100 microns). See the SSC background webpage for further details:
Choice of either full array or subarray modes, allowed
frame times and number of repeats.
Note: In the IRAC Mapping AOT, the user can select
mapping/dither strategies that may increase the depth of coverage
per pixel, for a given number of repeats. In the Performance
Estimation Tool, the user mimics this by adjusting the "effective"
number of repeats accordingly.
User input: full array or subarray mode, frame time and number of repeats.
PHOTOMETRY AND SUPER RESOLUTION
MODE: For each of the three MIPS passbands, the user
selects the instrument configuration, determining the
exposure time, number of repeats, as well as
pixel scale (70 micron array only), and field size.
Note: In the MIPS Photometry and Super Resolution AOT,
the user can select field size/sky offset strategies that may
increase the depth of coverage per pixel, for a given number of
repeats. In the Performance Estimation Tool, the user mimics
this by adjusting the "effective" number of repeats
accordingly.
For
each of the three MIPS passbands, the user selects the
instrument configuration, determining the scan rate, and
number of scan passes.
Note: In the MIPS Scan Map AOT, the user can select
cross scan steps and number of map cycles that may increase the
depth of coverage per pixel, for a given number of scan
passes. In the Performance Estimation Tool, the user mimics
this by adjusting the "effective" number of scan passes
accordingly.
User input: scan rate (70 micron array only), and number of map passes.
Output:
WAVEBANDS: The Spitzer imaging
passbands are normally quoted in the Spitzer documentation as 3.6,
4.5, 5.8, 8.0 for IRAC, and 24, 70, 160 microns for MIPS. The
calculations in the PET are referenced to more precise
determinations of the "average wavelength" in each passband,
calculated as follows:
IRAC: the average wavelength in each passband is
defined as:
and is the IRAC system response
function, available online at:
Numerically, this evaluates to 3.55, 4.49, 5.73, and 7.87 microns,
very close to the fiducial wavelengths quoted throughout the
Spitzer literature for the IRAC passbands.
MIPS: the calculation is slightly different. Define
, where R is the
system response function given online at:
For the analytic SED models (power law,
blackbody, modified blackbody) these are calculated
analytically. For the named objects and composite SEDs, a simple
log-linear interpolation is performed between the
measured/pre-determined flux densities. Assumes point sources.
COLOR CORRECTION: For named
object and composite SEDs, the color corrections are small, and are
assumed to be unity by the EX-PET. However, the EX-PET calculates
the color corrections explicitly for blackbody, modified-blackbody
and power law SEDs as follows.
Both IRAC and MIPS are broadband photometers. The color
correction provides a prescription for interpreting the data for
sources with spectral shapes other than the nominal one assumed in
the calibration process. With Spitzer, source flux densities, , are determined at the
nominal instrument passband wavelengths. For IRAC and MIPS, the reference
calibrator varies, and we consider each case in turn below.
IRAC: calibration is set that, accounting for the
instrument response, for sources with a flat spectrum:
For other SEDs, we need to calculate the color correction
as follows. Define the color correction, K, as , where is the frequency
corresponding to the ``average'' wavelength in each
passband, defined as
and is
the system response function, available online at:
For point sources, the instrument
sensitivities have been pre-calculated as a function of exposure
time, number of repeats, and background level. The output is for
each Spitzer passband (3.6, 4.5, 5.8, 8.0, 24, 70, 160 microns
for IRAC+MIPS).
For IRAC in subarray mode, 64 exposures are taken. The
sensitivity estimates returned by the PET assumes that the
sensitivity of the combined image has scaled as 1/sqrt(64) times
the sensitivity of the individual images.
Further details on sensitivities are available online, and in the
SOM. Please see:
For IRAC, the total exposure time per pixel is as
follows. In full-array mode, it is approximately the
frame time multiplied by the number of
repeats. In subarray mode, exposures are taken in
sets of 64, hence the exposure time = 64 * frame
time. These estimates returned by the PET do not
subtract the time taken in the endpoint readouts; see
the IRAC handbook for more information:
Note: In the IRAC Mapping AOT, the user can
select mapping/dither strategies that may increase the
depth of coverage per pixel, for a given number of
repeats. In the Performance Estimation Tool, the user
mimics this by adjusting the "effective" number of
repeats accordingly.
For MIPS, the total exposure time per pixel is somewhat
more complex. For example, Photometry/Super Resolution
compact source photometry mode yields 14 exposures per
cycle in the 24 micron band, and hence a 3 second frame
time gives a 42 second integration time per pixel per
cycle.
For all of the MIPS bands, and the Scan Map and
Photometry and Super Resolution AOTs, the conversion
from frame time to integration time per pixel per cycle
is summarized in the MIPS handbook:
Note: In the MIPS Scan Map AOT, the user can
select cross scan steps and number of map cycles that
may increase the depth of coverage per pixel, for a
given number of scan passes. In the Performance
Estimation Tool, the user mimics this by adjusting the
"effective" number of scan passes accordingly.
Similarly, in the MIPS Photometry and Super Resolution
AOT, the user can select field size/sky offset
strategies that may increase the depth of coverage per
pixel, for a given number of repeats. In the Performance
Estimation Tool, the user mimics this by adjusting the
"effective" number of repeats accordingly.
S/N in IRAC/MIPS bands: a very simple
estimate, dividing the color-corrected source flux density by
the (1-sigma) sensitivity in each of the Spitzer passbands. Assumes point sources.
For MIPS 24 micron Photo/Super Resolution mode: 30s frame
time not recommended for high background (saturation
warning).
Confusion limits: warnings are given if the
predicted sensitivity falls below
the prediction for the 1-sigma confusion limit. Details on
the confusion limit predictions are given in the IRAC and
MIPS handbooks:
Also note that the confusion limits are lower
limits to the actual position dependent on-sky
confusion. The lower limits shown on the low background
sensitivity charts are for regions of lowest expected
confusion at high Galactic latitudes and on clean sky. The
observer should consider the local confusion caused by
background sources when planning observations. Confusion
will likely be more important in higher background regions,
and can limit the sensitivity that can be achieved. Local
sources of confusion, such as cirrus and the stellar
background, are highly variable and can be very localized.
Also note that the accuracy of photometry at 70 and 160
microns will often be confusion-limited. Because MIPS
provides much smaller effective beams and higher sensitivity
than any previous mission, determining the confusion limit
set by such sources is difficult. Current estimates of the
1-sigma confusion limits range from about 0.5 to 1.3 mJy at
70 microns, and from about 7 to 19 mJy at 160 microns (Xu et
al, 2001, ApJ, 562, 179; Franceschini et al., 2002,
astro-ph/0202463; Dole et al., 2002, ApJ, 585, 617). The
above values should serve as a guide for determining if a
particular observing program is feasible. Other factors may
influence the effective confusion limit for a particular
observation. In some instances, it may be reasonable to
integrate somewhat below the level of the confusion, for
example when the observer has a priori knowledge of a source
position. On the other hand, the presence of a nearby bright
source with its diffraction artifacts will increase the
effective confusion limit. Moving targets offer the
possibility of taking a second "shadow" observation,
allowing the suppression of confusing source by subtracting
them away. Observers are warned that they need to specify
AORs with enough cycles to provide adequate rejection of
cosmic rays and other artifacts, even if a very short
integration would nominally be adequate to reach the
confusion limit.
Saturation limits: warnings are given if the
predicted source flux density
is greater than the prediction for saturation.
The saturation limits used in the PET do not include any
diffuse emission components. See the instrument handbooks for
more details:
160 micron enhanced mode: One of the conclusions from the analysis of many
years of 160 micron calibration data, plus analyis of
some technically challenging science programs (e.g., new
planets in the Solar System or Kuiper Belt objects) is
that to improve both the photometric accuracy and
repeatability of the 160 micron small field observations,
the AOT needed to be modified. This led to the
development of an "enhanced" 160 micron small field
photometric mode for cycle-4. This mode was not
available in SPOT until after the proposals had been
accepted in 2007, but you could propose to use it in
cycle-4.
The 160 micron enhanced photometric mode relies on
the same principles of small field photometry, but
provides a larger field of view and a more uniform
coverage at a given single nodding position. This is
accomplished by increasing the number of DCEs, modifying
the stim-cycle and optimizing scan mirror dither
pattern. Tests indicate that both the
repeatability and the photometric accuracy are improved
by 15-20%, with a decrease in sensitivity of
approximately 22%.
The 160 micron enhanced photometric mode takes 30
DCEs per cycle, in comparison with the 20 DCEs obtained
by small field photometry. We estimate a 40% time
increase per cycle to operate in this mode.
Note: Sensitivity for enhanced mode has only been estimated in the case of low background.
See snirac for Warm IRAC S/N when the observations are not background-noise-limited.